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Evolution™ 201/220 紫外可见分光光度计

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产品型号840-210800/840-210600

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更新时间:2022-05-25 22:30:03浏览次数:40次

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2011 年度 R&D 100 大奖获得者。采用 Thermo Scientific™ Evolution 201 和 220 紫外-可见光分光光度计进行分析,扩展了实验室的应用范围,并提高了生产率。新一代 Thermo Scientific™ INSIGHT™ 软件可同时应用于平板电脑和计算机控件,确保您的仪器紧跟技术潮流,并随时应对新的样品挑战。我们的自定义用户环境 (CUE) 软件允许您*
货号产品规格类型 
 840-210800EachEvolution 201 UV-Vis Spectrophotometer, Computer Control, includes Euro/US/UK power cords 
完整参数  ▼
产品规格Each
准确度(光度)0.5: ±0.004; 1: ±0.006; 2: ±0.010; Measured at 440nm using neutral density filters traceable to NIST™
基线平坦度±0.0010A, 200-800nm, 1.0nm SBW, smoothing
射束几何形状Double-beam
认证/合规ISO 9001:2008
连接USB or RS-232
Data Interval10, 5, 2, 1.0, 0.5, 0.2, 0.1nm
描述Cutting-edge instrumentation, intuitive and powerful software, and a wide range of accessories consistently deliver high quality results and improved productivity.
检测器类型Dual Silicon Photodiodes
Dimensions (L x W x H)62.2 x 48.6 x 27.9 cm (24 x 19 x 11 in)
显示None
漂移<0.0005A/hr, 
500 nm, 1.0 nm SBW, 1 hr warm-up
Electrical Requirements100-240V 50-60Hz, selected automatically, 150W maximum
物品描述Evolution 201 UV-Vis Spectrophotometer, Computer Control, includes Euro/US/UK power cords
Xenon Flash Lamp, 3 year warranty (7 years typical lifetime)
噪声0A: <0.00015A; 
1A:<0.00025A; 
2A: <0.00080A; 
260 nm, 1.0 nm SBW, RMS
操作系统Microsoft Windows 7, Windows 8
光学设计Double Beam with sample and reference cuvette positions; Czerny-Turner Monochromator
路径长度(公制)Up to 100 mm cuvettes
Pharmacopoeia Compliance TestingPhotometric Accuracy (60mg/L K2Cr2O7): ±0.010A
Stray Light: ≤1%T at 198 nm: KCI; ≤0.05%AT at 220 nm: Nal, Kl
Wavelength Accuracy: ±.5 nm 541.9, 546.1nm Hg emission lines, ±0.8 nm full range
Wavelength Repeatability: ≤0.05 nm, repetitive scanning of 546.1 nm Hg emission line
Photometric Accuracy Instrument1A: ±0.006A
2A: ±0.010A
Measured at 440 nm using calibrated neutral density filters traceable to NIST
Photometric Display-0.3 to 4.0A
Photometric Range>3.5A
Photometric Repeatability±0.0002A
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R). log (Abs) Abs*, Intensity
扫描速度.<1-6000 nm/min, variable
光谱带宽1.0 nm
类型Evolution 201 UV-Vis Spectrophotometer, Computer Control, includes Euro/US/UK power cords
瓦数150W max.
波长精度±0.5 nm  (541.9, 546.1 nm mercury lines); 
±0.8 nm (full range 190 to 1100 nm)
波长范围190 to 1100 nm
波长重复性≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)
波长扫描速度<1 to 6000; variable
重量(英制)32 lb
重量(公制)14.4 kg
 840-210600EachEvolution 220 UV-Vis Spectrophotometer, Computer Control, includes Euro/US/UK power cords 
完整参数  ▼
产品规格Each
基线平坦度±0.0010A, 200-800 nm, 1.0nm SBW, smoothing
Data Interval10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
描述Cutting-edge instrumentation, intuitive and powerful software, and a wide range of accessories consistently deliver high quality results and improved productivity
检测器类型Dual Silicon Photodiodes
Dimensions (L x W x H)62.2 x 48.6 x 27.9 cm (24 x 19 x 11 in)
显示None
漂移<0.0005A/hr, 500nm, 1.0nm SBW, 1 hr warm-up
Electrical Requirements100-240V 50-60Hz, selected automatically, 150W maximum
物品描述Evolution 220 UV-Vis Spectrophotometer, Computer Control, includes Euro/US/UK power cords
键盘Sealed membrane
Xenon Flash Lamp, 3 year warranty (7 years typical lifetime)
噪声0A: <0.00015A; 
1A: <0.00025A; 
2A: <0.00080A; 
260 nm, 1nm SBW, RMS
操作系统Microsoft Windows 7, Windows 8
光学设计Double Beam with sample and reference cuvette positions; Application Focused Beam Geometry; Czerny-Turner Monochromator
Pharmacopoeia Compliance Testing(Guaranteed Performance Specifications)
Resolution (toluene in Hexane): ≥1.8A
Photometric Accuracy (60 mg/L K2Cr2O7): ±0.010A
Stray Light: ≤1%T at 198 nm: KCI; ≤ to 0.05 %AT at 220nm: Nal, Kl
Wavelength Accuracy: ±0.5 nm 541.9, 546.1 nm Hg emission lines, ±0.8 nm full range
Wavelength Repeatability: ≤0.05 nm, repetitive scanning of 546.1nm Hg emission line
Photometric Accuracy Instrument1A: ±0.006A
2A: ±0.010A
Measured at 440 nm using calibrated neutral density filters traceable to NIST
Photometric Display-0.3 to 4.0A
Photometric Range>3.5A
Photometric Repeatability±0.0002A
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs*Factor, Intensity
扫描速度.<1-6000nm/min, variable
光谱带宽Variable: 1.0nm; 2.0nm; AFBG Microcell optimized; AFBG Fiber optic optimized; AFBG Materials optimized
类型Evolution 220 UV-Vis Spectrophotometer, Computer Control, includes Euro/US/UK power cords
波长精度±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
波长范围190 to 1100 nm
波长重复性≤0.05nm (546.11nm mercury line, SD of 10 measurements)
重量(英制)32 lb
重量(公制)14.4 kg

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